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RIGOL DG5000 Pro Series
New Generation Multi-channel Waveform Generation Solution Platform
It supports the generation of pulse trains with an editable pulse width ranging from 2 to 30, and can easily build application scenarios such as dual - pulse tests. It is an ideal tool for analyzing the dynamic parameter characteristics of power semiconductor devices.
With the sequence editing function of up to 512 steps, it supports the one-time arrangement of multiple waveforms, automating tedious and repetitive work. While significantly improving test efficiency, it ensures the consistency and repeatability of complex test processes.
It supports generating superimposed signals of up to 16 tones, and the amplitude and phase of each tone can be flexibly edited. It helps to efficiently complete the analysis of intermodulation distortion and nonlinear characteristics of devices such as amplifiers and filters.
Supports pseudo-random binary sequences (PRBS2 - PRBS32) with a baud rate of up to 300M or user-defined patterns. It provides a direct and reliable signal source for verifying the performance of high-speed serial buses and digital interface receivers (such as performing eye diagram and bit error rate tests).
Power semiconductor dynamic parameter testing (a comprehensive evaluation method for the switching characteristics of switching tubes, namely the double-pulse test, has been developed based on the half-bridge circuit) is a core evaluation tool in the R & D and application of power semiconductors. It not only provides key dynamic parameters but also reveals the potential risks and optimization directions of devices by simulating actual working conditions.
